Design for testability of a modular, mixed signal family of VLSI devices
Ed Flaherty, A Allan, J. Morris · 2002
Recent advances in semiconductor design and fabrication have made it possible to integrate an entire system including digital microcontrollers, memories, analog and power devices onto a single silicon chip. The complexity of test has increased greatly due to the embedded nature of these devices and also the significant economic pressure to maximize the number of analog/power pins and minimize test access pins. This paper describes the application of previously developed DFT techniques to a configurable family of highly integrated mixed signal devices and the strategy for achieving modular re-usable tests for mixed signal automatic test equipment.>