Static Compaction of Delay Tests Considering Power Supply Noise
Jing Wang, Xiang Lü, Wangqi Qiu, Ziding Yue, S. Fancler, Weiping Shi, D.M.H. Walker · 2005
Excessive power supply noise can lead to overkill during delay test. A static compaction algorithm is described in this paper that prevents such overkill. A power supply noise estimation tool has been built and integrated into the compaction process. Compaction results for KLPG delay tests for ISCAS89 circuits under different power grid environments are presented.