Experimental results from I/sub DDF/ testing
Claude Thibeault, A. Payeur · 2002
In this paper, we present experimental results from a test method, called I/sub DDF/ testing, based on the multiple sampling and processing of the consumption current, I/sub DD/. This method can be seen as an extension of I/sub DDQ/ testing since the I/sub DD/ frequency spectrum, instead of DC levels, is used to detect defects or faults. The results show that our method is less sensitive to noise than I/sub DDQ/ testing.