Fault diagnosis for analog integrated circuits based on the circuit layout
H.-C.H. Liu, Mani Soma · 1991
An approach to the fault diagnosis for analog integrated circuits is proposed. It uses fault models from the defect statistics to generate faulty circuits. Fault simulations are then applied to those faulty circuits to generate different fault classes which can be used for the fault diagnosis for analog integrated circuits. An example is also given to demonstrate this approach.>