Embedded Test Resource to Reduce the Required Memory and Channels of Tester
Yinhe Han, Yu Hu, Huawei Li, Xiaowei Li · 2006
An embedded test stimulus decompressor is presented to generate the test patterns, which can reduce the required vector memory and channels of automatic test equipment(ATE). The decompressor consists of a periodically alterable MUX network which has multiple configurations to decode the input information flexibly. A complete synthesis flow is presented to generate the MUXs network automatically. With the dedicated efforts, the low-cost ATE with low data bandwidth can be used to test the system-on-a-chip with high complexity.