A high speed and area efficient on-chip analog waveform extractor
A. Hajjar, Gordon Walter Roberts · 2002
A multiple pass A/D conversion technique is proposed for mixed-signal test applications. Only a single on-chip comparator and sample-and-hold circuit is required to digitize repetitive analog waveforms. Simulations show 10 bits of amplitude resolution at 300 MHz for a bipolar comparator design (0.8 /spl mu/m BiCMOS process), and 10 bits of amplitude resolution at 667 MHz for a CMOS comparator design (0.5 /spl mu/m CMOS process). A prototype IC designed for a 0.5 /spl mu/m CMOS process has been sent for fabrication. Experimental results from a prototype board (implemented with discrete components) are given.