Testing and Structured Design
Erik P. DeBenedictis, Charles L. Seitz · CaltechAUTHORS (California Institute of Technology) · 1982
This paper describes part of an integrated circuit testing project carried out at Caltech between 1979 and 1982. The central theme and result of the project is a language or notation for describing tests for complex integrated circuits. The evolution of this test language has been guided by many considerations, including (1) its implementation in a working, interactive test system called FIFI, (2) its fit to ideas about the architecture of high-performance test instruments, and (3) its expressivity for a design-for-testability strategy for chip designs structured in the general style presented by Mead and Conway [1].