A persistent diagnostic technique for unstable defects
Yasuo Satô, L. Yamazaki, Hisamitsu Yamanaka, Tadashi Ikeda, Masahiro Takakura · 2003
We present a persistent diagnostic technique for unstable defects, such as open defects or delay defects. A new "segment model" diagnosis for the completely open defects is discussed. Here, we not only focus on the behavior of the principal offender, but also the behavior of the accomplices which cause the unstable behavior of the defect. In this paper, a technique using the layout information for an open fault diagnosis, and a testing method for the delay fault are discussed. Some experimental results of actual chips are shown.