Multiple fault testable sequential circuits
Pranav N Ashar, Srinivas Devadas, A. Richard Newton · 2002
The effects of multiple stuck-at faults on sequential circuits are analyzed. It is shown that the effects of multiple stuck-at faults on the state graph of a sequential circuit can be much more dramatic than the effects of single stuck-at faults. Methods for the synthesis of sequential circuits for high multiple fault testability are proposed.>