Cost effective digital filter design for concurrent test
I. Bayraktaroglu, Alex Orailoğlu · 2002
Invariant-based concurrent test schemes can provide economical solutions to the problem of concurrent testing of digital filters. Design methodologies for digital filters ensuring concurrent testability are outlined. Experimental results confirm through fault simulation 100% fault coverage within area cost comparable to that of DfT for off-line test and with error detection latency well below human response times.