Quantum Imaging and Metrology
Hwang Lee, Pieter Kok, Jonathan P. Dowling · arXiv (Cornell University) · 2003
The manipulation of quantum entanglement has found enormous potential for improving performances of devices such as gyroscopes, clocks, and even computers. Similar improvements have been demonstrated for lithography and microscopy. We present an overview of some aspects of enhancement by quantum entanglement in imaging and metrology.