Hardware and software tools for microprocessor functional test
Carsten Bellon, Raoul Velazco · HAL (Le Centre pour la Communication Scientifique Directe) · 1984
The GAPT project (automatic generation of test programs for microprocessors) is in its final phase. The various components of the project (method, software tools and hardware environment) are presented. A behavioral test method of programmable circuits based on the notion of behavioral sequential machine and the identification principle is proposed. A system for automated generation of microprocessor test programs has been realized: starting from a concise description of the microprocessor, GAPT generates the test programs in assembly languages and the successive signal configurations. Using GAPT, the test program of a microprocess can be generated within a few weeks. A specific test environment has been designed and realized: it allows automatic test program generation and is able to handle large test programs; thus the duration is not prohibitive (according to the chosen option, the test duration is from a few seconds to a few minutes for a MC68000).