Scan vs. functional testing - a comparative effectiveness study on Motorola's MMC2107/sup TM/
K. Tumin, C. Vargas, Richard L. Patterson, Ciro Nappi · 2002
Compares the test effectiveness of high coverage functional patterns with scan patterns for a microcontroller. Unlike previous studies, functional patterns with high coverage have been used in the comparison. Simulation fault grade and production data has been analyzed to evaluate whether scan patterns provide the same quality of coverage as functional test patterns.