PENTAG-a Petri net based automatic test pattern generator for sequential digital circuits
G. Witts, I. Alshahib · 1993
Describes an automatic test pattern generation program for sequential digital circuits using a modified implementation of Petri nets. This is achieved by the insertion of a FAN transition to the Petri net model. The resultant system compares favourably (12% more coverage and 30% faster) with similar ATPG programs based on the established D-algorithm path sensitization technique.