Analysis of large system black-box test data
Kent C. Clapp, Ravi K. Iyer, Y. H. Levendel · 2003
Studies black box testing and verification of large systems. Testing data is collected from several test teams. A flat, integrated database of test, fault, repair, and source file information is built. A new analysis methodology based on the black box test design and white box analysis is proposed. The methodology is intended to support the reduction of testing costs and enhancement of software quality by improving test selection, eliminating test redundancy, and identifying error prone source files. Using example data from AT&T systems, the improved analysis methodology is demonstrated.>