Flicker (1/f) Noise in 45^± Bi-Epitaxial Grain Boundary Junctions and dc SQUID of YBa2Cu3Oy
Baodian Yao, S.-H. Tsai, C. C., M. K. Wu · 2000
Wehavefabricated dc superconductingquantuminterferencedevices (SQUIDs) incorpo-rating 45 ± bi-epitaxial grain boundary junction, i.e. YBCO/YSZ and YBCO/YBCO/YSZ, in washer geometry. The1=f noise power of single junction comes fromresistance fluctuation for high current bias andcritical current fluctuation for low current bias. Thenoisespectrum of thedcSQUIDswasmeasuredwithdcandacbiasschemesandshowedvalueof » 1 £ 10 ¡ 5 © 0/Hz1=2 at 100 Hz. The possible noise sources, critical current fluctuations, flux motion noise and resistance fluctuation, are investigated. The results are compared with previous published data. PACS. 85.25.Cp – Josephson devices. PACS. 85.25.Dq – Superconducting quantuminterferencedevices (SQUIDs).