Genetic algorithm based test generation for sequential circuits
Li Shen · 2003
This paper deals with simulation and genetic algorithm (GA) based test generation for sequential circuits. We proposed a new sequential depth measure called sequential element reachability, which may be used as one of the parameters of the GA. For fitness functions, we propose a new dynamic testability measure, which can be evaluated in parallel for multiple individuals. The test generation is divided to three sub-problems: initialization, test vector generation for a group of faults and test sequence generation for a target fault. Using ISCAS89 benchmarks, experimental results for the GA are given.