CMOS Electronics: How It Works, How It Fails
J. Segura, Charles F. Hawkins · CERN Document Server (European Organization for Nuclear Research) · 2004
Foreword. Preface. PART I: CMOS FUNDAMENTALS. 1 Electrical Circuit Analysis. 1.1 Introduction. 1.2 Voltage and Current Laws. 1.3 Capacitors. 1.4 Diodes. 1.5 Summary. Bibliography. Exercises. 2 Semiconductor Physics. 2.1 Semiconductor Fundamentals. 2.2 Intrinsic and Extrinsic Semiconductors. 2.3 Carrier Transport in Semiconductors. 2.4 The pn Junction. 2.5 Biasing the pn Junction: I-V Characteristics. 2.6 Parasitics in the Diode. 2.7 Summary. Bibliography. Exercises. 3 MOSFET Transistors. 3.1 Principles of Operation: Long-Channel Transistors. 3.2 Threshold Voltage in MOS Transistors. 3.3 Parasitic Capacitors in MOS Transistors. 3.4 Device Scaling: Short-Channel MOS Transistors. 3.5 Summary. References. Exercises. 4 CMOS Basic Gates. 4.1 Introduction. 4.2 The CMOS Inverter. 4.3 NAND Gates. 4.4 NOR Gates. 4.5 CMOS Transmission Gates. 4.6 Summary. Bibliography. Exercises. 5 CMOS Basic Circuits. 5.1 Combinational logic. 5.2 Sequential Logic. 5.3 Input-Output (I/O) Circuitry. 5.4 Summary. References. Exercises. PART II FAILURE MODES, DEFECTS, AND TESTING OF CMOS Ics. 6 Failure Mechanisms in CMOS IC Materials. 6.1 Introduction. 6.2 Materials Science of IC Metals. 6.3 Metal Failure Modes. 6.4 Oxide Failure Modes. 6.5 Conclusion. Acknowledgments. Bibliography. Exercises. 7 Bridging Defects. 7.1 Introduction. 7.2 Bridges in ICs: Critical Resistance and Modeling. 7.3 Gate Oxide Shorts (GOS). 7.4 Bridges in Combinational Circuits. 7.5 Bridges in Sequential Circuits. 7.6 Bridging Faults and Technology Scaling. 7.7 Conclusion. References. Exercises. 8 Open Defects. 8.1 Introduction. 8.2 Modeling Floating Nodes in ICs. 8.3 Open Defect Classes. 8.4 Summary. References. Exercises. 9 Parametric Failures. 9.1 Introduction. 9.2 Intrinsic Parametric Failures. 9.3 Intrinsic Parametric Failure Impact on IC Behavior. 9.4 Extrinsic Parametric Failure. 9.5 Conclusion. References. Exercises. 10 Defect-Based Testing. 10.1 Introduction. 10.2 Digital IC Testing: The Basics. 10.3 Design for Test. 10.4 Defect-Based Testing (DBT). 10.5 Testing Nanometer ICs. 10.6 Conclusions. Bibliography. References. Exercises. Appendix A: Solutions to Self-Exercises. A.1 Chapter 1. A.2 Chapter 3. A.3 Chapter 4. A.4 Chapter 5. A.5 Chapter 6. A.6 Chapter 7. A.8 Chapter 8. A.8 Chapter 10. Index. About the Authors.