An efficient algorithm to partition the combinational circuits for pseudoexhaustive testing
Mohamed H. El-Mahlawy, W.A.J. Waller · 2002
We have presented an efficient algorithm to partition the combinational circuits for built-in pseudoexhaustive self-testing of VLSI circuits. The partitioning procedure is based on several heuristics that enable the procedure to overcome the unexpected results of the greedy heuristic procedure.