MATEG: a hierarchical test generator for module-based circuits
D.R. Chiang, Michal Cutler · 2003
The general algorithms and heuristics developed in the module-level automatic test pattern generator called MATEG are described. MATEG is a generalization of the branch-and-bound test generation algorithm for module-based circuits. MATEG retains accuracy of the deterministic test generation, and reduces computation time by exploiting the hierarchy in the circuit-under-test. Some experimental results are presented to demonstrate the efficiency of this approach.>