Results of a topologically partitioned parallel automatic test pattern generation system on a distributed-memory multiprocessor
Robert H. Bell, Robert H. Klenke, J.H. Aylor, R.D. Williams · 2003
The design and implementation of an object-oriented topologically partitioned parallel automatic test pattern generation (ATPG) system, ES-TPS, on a multiple-instruction multiple-data (MIMD) distributed-memory multiprocessor are described. The ATPG system is based upon the D-algorithm and performs test generation on a circuit which has been topologically partitioned across several processors. Fault partitioning and algorithmic parallelizations are included in the system to attempt to achieve speedup.>