Development of automated test procedures and techniques for LSI circuits
B. D. Carroll · NASA STI Repository (National Aeronautics and Space Administration) · 1975
Testing of large scale integrated (LSI) logic circuits was considered from the point of view of automatic test pattern generation. A system for automatic test pattern generation is described. A test generation algorithm is presented that can be applied to both combinational and sequential logic circuits. Also included is a programmed implementation of the algorithm and sample results from the program.