Application of multiple observation time strategy in test generation of digital sequential circuits
Yuri Skobtsov, Vadim Skobtsov, Sammy Hindi · International Conference on Experience of Designing and Applications of CAD Systems in Microelectronics · 2009
The test generation method is designed for digital circuits with memory on the basis of distinguishing state pairs of good and fault devices. The multiple observation time test strategy, 16-valued alphabet and genetic algorithms are used . The proposed method permits to cover the faults that are not detected with traditional methods. It increases the fault coverage.