Structure and metrology for a single-wire analog testability bus
Yunsheng Lu, Weiwei Mao, Ramaswami Dandapani, Ravi K. Gulati · 2002
A structure for testing the interconnect faults and measurement of discrete components on mixed-signal boards is proposed. The structure requires one analog pin in addition to the IEEE 1149.1 pins on each mixed-signal IC. Simulation results are provided to show the accuracy of the metrology.