System level testing of analog functions in a mixed-signal circuit
Mahmoud Al‐Qutayri · 2002
This paper outlines the problems of testing analog circuits in general and those in a mixed-signal integrated circuit in particular. It proposes a system level testing technique based on the excitation of the circuit-under-test with a pseudo-random binary sequence and subsequent estimation of its impulse response. The fault detection capability of the test and data analysis methods are demonstrated by simulation results. It also shows a feasible test structure that can be incorporated on chip to test the analog functions.