Impact of multiple-detect test patterns on product quality
Brady Benware, Chris Schuermyer, Nagesh Tamarapalli, Kun-Han Hans Tsai, Suresh C. Ranganathan, Robert Madge, Janusz Rajski, Prabhu Krishnamurthy · 2004
This paper presents the impact of multiple-detect test patterns on outgoing product quality. It introduces an ATPG tool that generates multiple-detect test patterns while maximizing the coverage of node-to-node bridging defects. Volume data obtained by testing a production ASIC with these new multiple-detect patterns shows increased defect screening capability and very good agreement with the bridging coverage estimated by the ATPG tool. 1.