The mathematical models for determination of spatial transformation coefficients of complicated configuration probes
V.L. Grishenko, И. А. Матвеева · 2003
Probes of complicated configuration are used for noncontact measurement of potential and charge surface distributions. The resolution and the sensitivity of such probe system are depended on spatial transformation coefficients for charge or potential and impedance of measuring circuit. The based-model method for determination of spatial transformation coefficients is described. The received expressions for planar-parallel and axis-symmetrical probe systems are considered.