ATPG implemented as an educational tool
Andrej Žemva, M. Leban, B. Zajc · 2002
The authors present an automatic test pattern generation system, called TEST, developed to upgrade software tools in the field of computer-aided design of digital integrated circuits. The TEST system consists of two modes for test generation. TEST-1 tries to generate a minimal test set for the complete single stuck-at-faults in the circuit, while TEST-2 generates a test for selected single stuck-at faults. Experimental results show that the test sets obtained by TEST-1 are nearly optimal.>