An approach to testability improvement of mixed-signal boards
J.S. Matos, João Canas Ferreira, A. Carneiro Leao, José Machado da Silva · 2002
The increasing complexity of mixed-signal boards makes an integrated analogue/digital testability approach an attractive proposition. This paper investigates one such approach based on the use of mixed-signal test support ICs together with standard board level test infrastructures. The architecture of a test support IC and preliminary experimental results are also presented.>