Application of boundary-scan and full-chip BIST to a 3 ASIC chip set
K.D. Fitch, J. R. Kane · 2002
Three ASIC (application-specific integrated circuit) devices recently designed at AT&T incorporate the ANSI/IEEE Std 1149.1-1990 testability features. The test port is used for control of on-chip boundary-scan (BS) and full chip (macrocell and random logic) built-in-self-test (BIST). Presented are a view of the methods used for implementation, novel circuit sharing between BIST and BS, and results related to device area, performance, fault coverage, and testing. The availability of boundary-scan allowed automatic generation of board-level test vectors and allowed board-level printed wire testing without bed-of-nails techniques. By applying BIST tools to the devices after functional design, fault coverage of all of the ASICs was increased to acceptable levels without the significant time and expense of manual vector writing.>