Tribute board and platform test methodology: intel's next generation test and validation methodology for platforms
Jay Nejedlo · 2004
Abstract Built-in self-test (BIST) has been historically silicon-centric in its application. This paper offers an overview of Intel’s next-generation platform test methodology, TRIBuTETM. TRIBuTETM is an Intel-coined acronym for Three-Reuseable-Integrated-Bist-u-TEchnologies. The TRIBuTETM approach targets the replacement of today’s standard platform testing process and exploits BIST in a novel way.... comprehensive board and platform testing.