An analog mixed-signal test controller
M. A. Abdel‐Halim · 2003
A design for test (DFT) technique for analog mixed-signal (AMS) system-on-a-chip (SoC) is presented; both methodology and implementation are introduced. Using the IEEE boundary scan standard 1149.4, small embedded analog test controller (ATC), and utilizes the embedded SoC memory. Using this structure almost any AMS-SoC can be tested for both manufacturing and on-line tests. This technique relaxes the tester requirements and enables cost effective on-line testing.