Determination of Complex Dielectric and Magnetic Properties of Materials
S. Weisbrod, Lee A. Morgan, Leroy R. Hughes · 2005
The paper describes a modified Von Hippel technique for determination of complex dielectric and magnetic properties of materials. The technique uses least square fit to derive the scatter matrix parameters for calibrating out internal reflection between the sample and the reflection measuring equipment. Least square fit is also used to determine best values of mu and epsilon.