Mixed-signal automatic test program generation
Aidan Keady, Colin Lyden, J. Ryan, S. Claffey, N. Murphy, B. Long · 2002
A novel program is presented which automates the generation of test programs for analogue and mixed-signal integrated circuits. The tests are entered graphically by the IC designer, providing a link between the design and test stages in IC development. The program developed can be used with any schematic entry front end capable of writing EDIF 200 netlists. The tests entered are checked by the program to ensure the tester has the necessary resources available and tester code is generated without further user input.>