Functional level ATPG and fault coverage
Sami A. Al-Arian · 2002
An ATPG (automatic test program generation) for combinational circuits based on a functional description is presented. In addition, a functional fault coverage is defined and related to structural fault coverage. The advantages of the functional fault models include early estimates of reliability of the design in the design process, reduced CPU time for fault simulation, and fault grading of the developed test vectors. The author also reports on the evaluation of the functional vs. structural models through a correlation of their simulation results.>