The use of IDDQ testing in low stuck-at coverage situations
P.C. Maxwell · 2002
An unresolved issue in IC testing is what mix of coverages of different types of test is required in order to achieve a given quality goal. This paper investigates the interaction between IDDQ and stuck-at coverage and examines the use of IDDQ to increase effective stuck-at coverage, particularly in situations where the graded coverage is lower than the desired goal. Empirical data is presented which examines the extent to which a varying number of IDDQ tests can detect parts which would fail stuck-at tests. This leads to development of a composite metric, based on stuck-at coverage, which allows a tradeoff to be made between adding further logic tests and adding IDDQ tests.