Current-mode BIST structure for mixed-signal circuits
Chun‐Lung Hsu, Keh-Chang Huang · 2003
A current-mode built-in self-test (CMBIST) structure for mixed-signal testing is presented in this work. The proposed CMBIST structure is based on the use of operational transconductance amplifiers (OTAs) and can be applied for current testing of analogue or digital circuits. The proposed CMBIST structure can increase the number of test points, which can be simultaneously sampled and controlled using current test data, thus taking less time for test signal observation. Additionally, the proposed CMBIST structure was fabricated in TSMC 1p4m CMOS 0.35 /spl mu/m technology. Also, simulation results and experimental measurements were obtained to verify the theoretical analysis. The results show that the proposed CMBIST structure is fully testable.