A programmable multiple-sequence generator for BIST applications
Meng Lieh Sheu, Chung Len Lee · 2002
In this paper, a programmable multiple-sequence generation scheme, which is constructed from a two-dimension-like feedback shift register structure, to generate a set of deterministic sequence of vectors followed by pseudo-random vectors is presented. A sequence segmentation method is employed to handle a long sequence of vectors. The proposed scheme has a regular structure, and the sequences so generated are more efficient in detecting faults for sequential circuit testing, stuck-open fault testing and delay fault testing. Hence, it is very suitable for the BIST application for MCM testing.