Test generation and design for test for a large multiprocessing DSP
G. Hetherington, G. Sutton, Kenneth M. Butler, T.J. Powell · 2002
The TMS320C80 is a programmable, parallel processing DSP. The test approach was an engineering mix of design for testability, test view creation, and verification. This mixture facilitated timely test generation and had other important benefits. We document the overall test methodology and the benefits derived therein.