On per-test fault diagnosis using the X-fault model
Xiaoqing Wen, Tokiharu Miyoshi, Seiji Kajihara, Laung‐Terng Wang, Kewal K. Saluja, K. Kinoshita · 2005
This work proposes a new per-test fault diagnosis method based on the X-fault model. The X-fault model represents all possible behaviors of a physical defect or defects in a gate and/or on its fanout branches by using different X symbols on the fanout branches. A novel technique is proposed for analyzing the relation between observed and simulated responses to extract diagnostic information and to score the results of diagnosis. Experimental results show the effectiveness of our method.