Delay defect screening using process monitor structures
Subhasish Mitra, Erik H. Volkerink, Edward J. McCluskey, S. Eichenberger · 2004
This paper presents delay test data collected from test chips fabricated in a 0.18 /spl mu/ technology. The experimental data shows that process monitor structures such as on-chip ring oscillators are effective in identifying slow parts while performing transition fault testing at frequencies slower than the rated frequency.