IBIST/sup TM/ (Interconnect built in self-test) architecture and methodology for PCI express
Jay Nejedlo · 2004
This paper summarizes the test challenges associated with next generation platform buses and introduces an Intel developed technology called IBIST/spl trade/ created to meet those challenges. The IBIST/spl trade/ testing methodology and associated on-die architecture customized for the PCI Express (PCIe) interface are described.