Impact on inter symbol interference (ISI) noise due to simulation error
Bidyut Kumar Bhattacharyya, Bao Shu Xu, S. Bhattacharya · 2006
In this paper, we are going to discuss the error in determining the actual intersymbol interference noise (ISI) due to different circuit simulation methodology, while using a standard circuit simulator. In this paper, we have compared three different methods to predict accurately ISI noise. All three methods show that errors caused by circuit simulation can make the eye worst. We have also shown a method which allows one to determine that error and calculate the actual range of ISI noise. As we move towards sampling mVolt signals at the receiver end (Bhattacharyya, 2004 and Bhattacharyya, 2005), one needs to minimize the error that arises due to circuit simulation methodology. This is essential, in order to predict the actual performance of the interconnect.