High speed ring generators and compactors of test data [logic IC test]
Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer · 2003
This paper presents a new highly modular architecture of generators and compactors of test patterns. This structure has fewer levels of logic, smaller fan-out, reduced area, and operates at faster speed than external feedback LFSRs, internal feedback LFSRs, and cellular automata, all implementing the same characteristic polynomial.