Exploiting Don't Car es in Test Patterns to Reduce Power During BIST
José C. Costa, Paulo F. Flores, Horácio C. Neto, Jose Carlos Monteiro, João P. Marques-Silva · 1998
Abstract — For a significant number of electronic systems used in safety-critical applications circuit testing is performed periodically. For these systems, power dissipation due to Built-In Self Test (BIST) can represent a significant percentage of the overall power dissipation. One possible solution to address this problem consists of test pattern reordering with the purpose of reducing the amount of power dissipated during circuit testing. By reordering test patterns one is able to find test sequences for which power dissipation is minimized. Moreover, a key observation is that test patterns are in general expected to exhibit don’t cares, which can naturally be exploited during test pattern reordering. In this paper we describe efficient algorithms for test pattern reordering in the presence of don’t cares. Preliminary experimental results amply confirm that the power savings due to test pattern reordering using don’t cares can be significant. 1.