Cellular automata based test structures with logic folding
Biplab Kumar Sikdar, Sourav Kumar Das, Souvik Roy, Niloy Ganguly, Debesh Kumar Das · 2005
This work presents an efficient test solution for VLSI circuits. The test structure is designed with GF(2/sup P/) CA. The introduction to an innovative scheme of logic folding optimizes the cost of test logic that can not be feasible with the flattened structure of GF(2) CA/LFSR.