An event-driven incremental timing fault simulator
Shyh-Jye Jerry Jou, Wen-Zen Shen, Shwu-Huey Chiou · 2002
An efficient MOS multiple sets of multiple faults simulator with electrical timing information is presented. By using event-driven, selective trace and mixed incremental-in-space, signal and time simulation techniques, the simulation results show that it is superior in speedup, extra memory used and precision to other approaches. Moreover, this simulator is suited for parallel simulation in a multiprocessor system.>