Single fault detection tests for generalized iterative switching circuits
Дмитрий Сергеевич Романов, E. Yu. Romanova · Moscow University Computational Mathematics and Cybernetics · 2015
It is established that for nonconstant Boolean function f(x 1, …, x n ), there is a testable generalized iterative switching circuit in which function f(x 1, …, x n ) is realized and the single fault detection test of constant length is assumed.