Low-voltage analog current detector supporting at-speed BIST
S. Dragic, Igor M. Filanovsky, Martin Margala · 2003
This paper presents a design of a low-voltage analog current detector supporting the at-speed Built-In-Self-Test (BIST) methodology. In testing mode, the current detector performs a non-functional Iddq and delta Iddq test which enables a more accurate fail/pass decision. A 1.2 V high-frequency current amplifying cell is utilized. With a sensitivity of less than 200 nA, the detector achieves a wide gain-bandwidth product of 6.8 GHz and the low frequency current gain of 48 dB. The operation of the detector has been verified experimentally. The current detector has been implemented in 0.13 /spl mu/m CMOS technology.