Global and local parametric diagnosis of analog short‐channel CMOS circuits using homotopy‐simplicial algorithm
Michał Tadeusiewicz, Stanisław Hałgas · International Journal of Circuit Theory and Applications · 2013
SUMMARY The paper offers an algorithm for local and global parametric diagnosis in nonlinear analog circuits, including both identification of the faulty parameters and determination their values. The algorithm exploits a nonlinear algebraic type test equations which may possess multiple solutions, corresponding to different sets of the parameters values which meet the test. To find the solutions, the homotopy concept is applied. Since the test equation is not given in explicit analytical form, the simplicial method is used to trace the homotopy path. The proposed approach can be applied to a broad class of analog circuits, including the complementary metal–oxide–semiconductor circuits fabricated in nanometer technology. The developed diagnostic procedure has been implemented in DELPHI, whereas the required by the algorithm repeated circuit analyses are carried out using IsSPICE 4 and both environments have been joined together. For illustration, two numerical examples are given. Copyright © 2013 John Wiley & Sons, Ltd.